Electronic Design

Reduce Test/Diagnosis Cost with Optimized Scan-Pattern Ordering

Download this article in PDF format. Finding the right balance among test cost, test quality, and data collection for running diagnosis requires consideration of several competing factors. Luckily ...
Hackaday

test pattern

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...
Semiconductor Engineering

Reducing Chip Test Costs With AI-Based Pattern Optimization

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.
Electronic Design

Design-For-Test The Smart Way: dFT With A "Big T" And A "Little d"

Design-for-test, or DFT, should facilitate high-quality test, not change the design. Test techniques and strategies need to supply a high-quality test that screens out defective devices, avoiding ...
Semiconductor Engineering

Using Critical Area To Boost Automotive IC Test Quality

To compete in the fast-growing market for automotive ICs, semiconductor companies need to address new challenges across the entire design flow. To meet the ISO 26262 goal of zero defective parts per ...