GitHub

Image Generation Tutorial

This feature allows you to generate images using diffusers models like Tongyi-MAI/Z-Image-Turbo directly within the web UI. Note: Image generation does not work with ...
AZOM

Advanced SEM Imaging in a Space Saving Design

Scanning electron microscopes (SEMs) facilitate significant scientific advancements by enabling researchers to investigate the properties of biological specimens and materials. However, traditional ...
AZOM

Advanced Imaging Made Simple with Tabletop SEM

Despite their capabilities, these instruments frequently deliver image resolutions that exceed the requirements of typical analytical tasks. In recent years, compact Tabletop SEMs have emerged as ...
Mississippi State University

MSU faculty members secure grant for region’s first advanced scanning electron microscope

STARKVILLE, Miss.—Mississippi State’s Institute for Imaging and Analytical Technologies soon will be home to a scanning electron microscope so advanced that it will be the first of its kind in the ...
today.ucsd

Simple Algorithm Paired with Standard Imaging Tool Could Predict Failure in Lithium Metal Batteries

Scanning electron microscopy (SEM) images are already a common staple of battery research. Now, they can be paired with a simple algorithm to enable better prediction of lithium metal battery ...
today.ucsd

Living Materials Now Easier to Build with a Larger Palette of Ingredients

Scanning electron microscope image of an engineered living material created by diffusion of live cyanobacteria cells (green) into poly(N-isopropylacrylamide), a temperature-responsive polymer. Credit: ...
Frontiers

Microstructure characterization of tight reservoirs using micro-CT and FIB-SEM imaging technology

This study presents a comprehensive investigation into the intricate microstructural characteristics of tight reservoir rocks, utilizing advanced micro-CT scanning and FIB-SEM technologies. Micro-CT ...
Business Wire

JEOL: Release of Schottky Field Emission Scanning Electron Microscope JSM-IT800(i)/(is) Versions

TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...
Frontiers

A comprehensive overview of focused ion beam-scanning electron microscopy (FIB-SEM) applications for the evaluation of outer retina

The retina is the light-sensitive inner layer of the eye, consisting of multiple cell types organized into ten distinct layers of neurons interconnected by synapses that play a crucial role in visual ...
Semiconductor Engineering

Overview Of 103 Research Papers On Automatic SEM Image Analysis Algorithms For Semiconductor Defect Inspection (KU Leuven, Imec)

A new technical paper titled “Scanning electron microscopy-based automatic defect inspection for semiconductor manufacturing: a systematic review” was published by researchers at KU Leuven and imec.
IEEE

SEM Deep Learning Multiclass Noise Level Classification With Data Augmentation

Abstract: Scanning electron microscopy (SEM) plays an important role in providing high-resolution imaging in various fields, including industrial chip manufacturing, materials science, and nanoscale ...